EDFAS Virtual Workshop

Monday, December 7, 2020

Monday | Tuesday | Wednesday | top

10:00 AM-10:50 AM


WELCOME: Open Remarks and FA Roadmap

10:50 AM-12:30 PM


Emerging FA Techniques and Concepts
Session Chair: Dr. Keith Serrels and Dr. William Lo

12:30 PM-1:30 PM


Tools of the Trade Tour

Visit the Virtual Expo Hall

1:30 PM-2:45 PM


Product Yield, Test & Diagnostics
Session Chair: Mr. Jayant D'Souza and Mr. Rommel Estores

1:30 PM-3:10 PM


3D Device Failure Analysis
Session Chair: Dr. Shidong Li and Ms. Claudia Keller

3:10 PM-3:30 PM


Break

3:30 PM-3:55 PM


Board and System Level FA
Session Chair: Mr. Jason Wheeler and Ms. Becky Holdford

3:30 PM-4:20 PM


Microscopy
Session Chair: Mr. Ryan Fredrickson

3:55 PM-4:20 PM


Scanning Probe Analysis
Session Chair: Dr. Pai Tangyunyong and Mr. Phil Kaszuba

4:20 PM-4:45 PM


Space Application FA
Session Chair: Dr. Zachary Lingley and Mr. John Bescup

Tuesday, December 8, 2020

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10:00 AM-11:00 AM


Keynote Session: Tim Brosnihan, SEMI
Session Chair: Dr. David Grosjean

11:00 AM-12:20 PM


Panel Discussion: Trends and Challenges in 3D Packaging & MEMS Failure Analysis
Session Chair: Dr. Christian Schmidt and Mr. Kristofor Dickson

12:20 PM-1:20 PM


Lunch & Learn Workshop: ZEISS - Advanced Package Analysis Solutions for the More-than-Moore Era

Visit the Virtual Expo Hall

1:20 PM-2:50 PM


Poster Session I
Session Chair: Dr. Felix Beaudoin

Poster Session II
Session Chair: Ms. Yan Li

2:50 PM-3:25 PM


Break

3:25 PM-4:40 PM


Packaging and Assembly Level FA
Session Chair: Dr. Peng Li and Ms. Kannu Wadhwa

Sample Prep and Device Deprocessing
Session Chair: Dr. Erwin Hendarto and Dr. Chuan Zhang

Wednesday, December 9, 2020

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10:00 AM-11:40 AM


Hardware Attacks, Security, and Reverse Engineering
Session Chair: Mr. Luigi Aranda and Dr. E.L. Principe

10:00 AM-12:05 PM


Case Studies: Device Analysis
Session Chair: Mr. Stephen Fasolino and Mr. Jeff Gambino

11:40 AM-12:05 PM


FIB Circuit Analysis and Edit
Session Chair: Mr. Antonio Tollis and Dr. Daminda Dahanayaka

12:05 PM-12:30 PM


AI Application for FA
Session Chair: Dr. Manish Sharma and Dr. Bill Hammond

FIB Sample Preparation I
Session Chair: Ms. Rose Ring and Dr. Cathy Vartuli

12:30 PM-1:30 PM


Lunch & Learn Workshop: Hitachi High-Tech America, Inc. - Using Hitachi Ethos NX5000 FIB-SEM for Failure Analysis and Material Science

Lunch Break

1:30 PM-2:20 PM


Case Studies: FA Process
Session Chair: Dr. Mike Bruce and Mr. Christopher Penley

FIB Sample Preparation II
Session Chair: Ms. Rose Ring and Dr. Cathy Vartuli

2:20 PM-3:10 PM


Fault Isolation I
Session Chair: Mr. Dan Bodoh and Dr. Jesse Alton

2:45 PM-3:10 PM


Nanoprobing and Electrical Characterization I
Session Chair: Mr. John Sanders and Mr. David Albert

3:10 PM-3:30 PM


Break

3:30 PM-4:20 PM


Fault Isolation II
Session Chair: Mr. Dan Bodoh and Dr. Jesse Alton

Nanoprobing and Electrical Characterization II
Session Chair: Mr. John Sanders and Mr. David Albert