Knowledge-based Object Localization in Scanning Electron Microscopy Images for Hardware Assurance

Wednesday, December 9, 2020: 12:05 PM
Ms. Hangwei Lu , Florida Institute for Cybersecurity, University of Florida, Gainesville, FL
Mr. Ronald Wilson , Florida Institute for Cybersecurity, University of Florida, Gainesville, FL
Mr. Nidish Vashistha , Florida Institute for Cybersecurity, University of Florida, Gainesville, FL
Dr. Navid Asadi , Florida Institute for Cybersecurity, University of Florida, Gainesville, FL
Dr. Mark Tehranipoor , Florida Institute for Cybersecurity, University of Florida, Gainesville, FL
Dr. Damon L. Woodard , Florida Institute for Cybersecurity, University of Florida, Gainesville, FL

Summary:

Object localization in scanning electron microscopy (SEM) images for hardware assurance
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