Case Studies: FA Process

Wednesday, December 9, 2020: 1:30 PM-2:20 PM
Dr. Mike Bruce, Consultant and Mr. Christopher Penley, Samsung Austin Semiconductor
1:30 PM
Electrical Probing Role in 14nm SOI Microprocessor Failure Analysis
Dr. Zhigang Song, IBM; Mr. Patrick McGinnis, IBM; Mr. David Albert, IBM
1:55 PM
Simple circuit edit passive voltage contrast technique to identify leakage location
Dr. S. L. Ting, Globalfoundries Singapore Pte Ltd.; Mr. P. K. Tan, Globalfoundries Singapore Pte Ltd.; Mr. Ishitha Withana, Globalfoundries Singapore Pte Ltd.; Dr. Hao Tan, Globalfoundries Singapore Pte Ltd.; Dr. C. Q. Chen, Globalfoundries Singapore Pte Ltd.
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