Lunch & Learn Workshop: Hitachi High-Tech America, Inc. - Using Hitachi Ethos NX5000 FIB-SEM for Failure Analysis and Material Science
Lunch & Learn Workshop: Hitachi High-Tech America, Inc. - Using Hitachi Ethos NX5000 FIB-SEM for Failure Analysis and Material Science
Wednesday, December 9, 2020: 12:30 PM-1:30 PM
Process control is an important key piece that applies to many aspects of the semiconductor industry. Metrology labs tackling ever-shrinking technology nodes require high accuracy, high resolution, along with analytical capabilities to assess failures in real time. In order to fill this need, the Hitachi Ethos NX5000 FIB-SEM configurable platform is designed to meet these challenges as a combined electron and ion microscope system packed with automated features with integrated analytical controls used for devices throughout the manufacturing chain. Join us for a webinar introducing multiple techniques and applications in the field of failure analysis to discover how Hitachi High Tech can deliver results.
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