TEM sample preparation for electron microscopy characterization and failure analysis of advanced semiconductor devices
TEM sample preparation for electron microscopy characterization and failure analysis of advanced semiconductor devices
Monday, October 28, 2024: 10:20 AM
The Pointe (Hilton San Diego Bayfront)
Summary:
Cecile Bonifacio has more than 19 years of experience in electron microscopy sample preparation, imaging, and analysis. Over this time period, she has authored/co-authored more than 60 publications, given presentations at various meetings and taught in Lehigh University’s Microscopy TEM and FIB courses. Cecile studied electron microscopy at San Joaquin Delta College and later assumed technician and failure analyst positions for Hitachi Global Storage Technology (San Jose, CA) and Micron Technology (Manassas, Virginia). She then pursued her advanced degrees in chemical engineering; M.S. at San Jose State University, PhD at University of California-Davis and her post-doctoral work at the University of Pittsburgh. Cecile joined Fischione Instruments as an applications scientist in 2016. At Fischione, Cecile focuses on Materials Science TEM applications development, provides application support for the TEM sample preparation products and cryo-transfer TEM holder product line through customer training and demonstrations. She is currently a Senior Applications Scientist.
Cecile Bonifacio has more than 19 years of experience in electron microscopy sample preparation, imaging, and analysis. Over this time period, she has authored/co-authored more than 60 publications, given presentations at various meetings and taught in Lehigh University’s Microscopy TEM and FIB courses. Cecile studied electron microscopy at San Joaquin Delta College and later assumed technician and failure analyst positions for Hitachi Global Storage Technology (San Jose, CA) and Micron Technology (Manassas, Virginia). She then pursued her advanced degrees in chemical engineering; M.S. at San Jose State University, PhD at University of California-Davis and her post-doctoral work at the University of Pittsburgh. Cecile joined Fischione Instruments as an applications scientist in 2016. At Fischione, Cecile focuses on Materials Science TEM applications development, provides application support for the TEM sample preparation products and cryo-transfer TEM holder product line through customer training and demonstrations. She is currently a Senior Applications Scientist.