50th International Symposium for Testing and Failure Analysis (October 28- November 1, 2024)
October 28 - November 1, 2024
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Mr. Michael Wong
Intel
Fremont, CA
USA N/A
Papers:
An Introduction to the FIB (Focused Ion Beam) as a Microchip Circuit Edit Tool
Fundamental Considerations in the Justification, Design & Construction of an Analytical Laboratory for High Tech Imaging & Processing Tools