Technology Specific and Featured Topics I

Monday, October 28, 2024: 9:00 AM-10:00 AM
202 (Hilton San Diego Bayfront)
Dr. Jason Holm, National Institute of Standards and Technology and Dr. William Hubbard, PhD, NanoElectronic Imaging, Inc.
9:00 AM
Machine Learning in Semiconductor Failure Analysis: Techniques and Case Studies
Mr. Michael Koegel, Fraunhofer Institute for Microstructure of Materials and Systems IMWS; Dr. Sebastian Brand, Fraunhofer Institute for Microstructure of Materials and Systems IMWS; Dr. Frank Altmann, Fraunhofer Institute for Microstructure of Materials and Systems IMWS
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