Analog Simulation and Fault Simulation for Failure analysis of analog circuits
Analog Simulation and Fault Simulation for Failure analysis of analog circuits
Thursday, October 8, 2026: 9:00 AM
Bridge Hall (Henry B. González Convention Center)
Summary:
Analog simulation and fault simulation are increasingly valuable complementary tools for failure analysis of analog and mixed-signal circuits. When standard fault isolation is inconclusive, internal signals are difficult to access, or the physical defect found does not immediately explain the observed failure mode, simulation can help guide the analysis and improve confidence in the conclusions. This tutorial presents a practical framework for using simulation in failure analysis. It first introduces the prerequisites needed to start, then explains the difference between nominal simulation and fault simulation, with a clear focus on their respective roles in FA. Nominal simulation can be used to understand circuit functionality, identify the most relevant internal signals to probe, and establish expected reference values. Fault simulation can be used to inject electrical faults, validate or reject defect hypotheses, and support diagnosis by reducing the set of plausible candidates. Through several real industrial case studies, the tutorial shows how simulation can support probing strategy, strengthen the interpretation of physical-analysis findings, and improve fault diagnosis before destructive analysis steps. The overall objective is to show how simulation, used together with classical FA techniques, can make analog failure analysis more focused, more efficient, and more defensible.
Analog simulation and fault simulation are increasingly valuable complementary tools for failure analysis of analog and mixed-signal circuits. When standard fault isolation is inconclusive, internal signals are difficult to access, or the physical defect found does not immediately explain the observed failure mode, simulation can help guide the analysis and improve confidence in the conclusions. This tutorial presents a practical framework for using simulation in failure analysis. It first introduces the prerequisites needed to start, then explains the difference between nominal simulation and fault simulation, with a clear focus on their respective roles in FA. Nominal simulation can be used to understand circuit functionality, identify the most relevant internal signals to probe, and establish expected reference values. Fault simulation can be used to inject electrical faults, validate or reject defect hypotheses, and support diagnosis by reducing the set of plausible candidates. Through several real industrial case studies, the tutorial shows how simulation can support probing strategy, strengthen the interpretation of physical-analysis findings, and improve fault diagnosis before destructive analysis steps. The overall objective is to show how simulation, used together with classical FA techniques, can make analog failure analysis more focused, more efficient, and more defensible.