52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026)
October 4 - 8, 2026
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An Introduction to the FIB (Focused Ion Beam) as a Microchip Circuit Edit Tool
Sunday, October 4, 2026: 10:20 AM
Mr. Steven Herschbein
,
IBM / GFS Retired, Hopewell Junction, NY
Dr. Shida Tan
,
NIST, Sunnyvale, CA
Mr. Richard H. Livengood
,
Si-Fi Consulting, LLC, Glen Ellen, CA
Mr. Michael Wong
,
ThermoFisher Scientific, Fremont, CA
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