An introduction to scan diagnosis and its application in failure analysis and yield analysis
An introduction to scan diagnosis and its application in failure analysis and yield analysis
Thursday, October 8, 2026: 8:00 AM
Bridge Hall (Henry B. González Convention Center)
Summary:
In this tutorial I will give a brief overview of design-for-test (DFT) techniques and methodologies. I will touch on how DFT enables FA workflows and the looming larger role it will play in advanced technologies.
In this tutorial I will give a brief overview of design-for-test (DFT) techniques and methodologies. I will touch on how DFT enables FA workflows and the looming larger role it will play in advanced technologies.