52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026)
October 4 - 8, 2026
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Dr. Paul van der Heide
Departement director
imec
Leuven Belgium 3001
Papers:
Quantum Diamond Microscopy as a Non-Destructive Method for Short Localization in High‑Density 2.5D MIMCAP