52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026): https://www.asminternational.org/istfa-2026/

52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026)
October 4 - 8, 2026

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Shinobu Uno

Leader
JEOL Ltd.
Akishima, Tokyo
Japan 1968558

Papers:

Enhanced Passive Voltage Contrast Imaging Using a Compound Lens Enabled by In-Lens Detector Optimization for Advanced Semiconductor Devices

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General Information

October 4 - 8, 2026


San Antonio, TX