52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026)
October 4 - 8, 2026
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Elia Halteh
NVIDIA
Silicon Failure Analysis Lab
Santa Clara, CA
USA 95050
Papers:
Adaptive Milling Guided by a 3D Digital Twin for Large-Area Deprocessing of Warped Advanced Packages and BEOL Stacks