52nd International Symposium for Testing and Failure Analysis (October 4-8, 2026)
October 4 - 8, 2026
Menu
Home
Start
Browse
Browse by Day
At-A-Glance
Author Index
Mr. Bjarne Schümann
CEO
DiaSense ApS
Copenhagen, Capital Region
Denmark 2100
Papers:
Breaking the Sensitivity and Speed Barriers of Quantum Diamond Magnetic Microscopy for Semiconductor Failure Analysis
