Electrical & Yield I

Sunday, October 4, 2026: 10:20 AM-12:20 PM

206A (Henry B. González Convention Center)

Mr. Randy Mulder, Silicon Labs and Dr. Bryan Tracy, PhD, Thermo Fisher Scientific

10:20 AM

Yield Basics for Failure Analysts
David Albert, IBM (Supplemental); Mr. Tracy Myers, ON Semiconductor

11:20 AM

Static Random Access Memory Failure Analysis
Dr. Zhigang Song, IBM

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