Large Area Coatings I

Wednesday, May 3, 2017: 8:30 AM-11:00 AM
Ballroom BC (Rhode Island Convention Center)
Michael Andreasen, Vacuum Edge
8:50 AM
Dense coating structures in magnetron sputtering using magnetically guided anodes
Frank Papa, Gencoa USA; Dr Tommaso Sgrilli, Gencoa Ltd; Robert Brown, Gencoa Ltd; Oihane Hernandez, Gencoa Ltd; Heqing Li, Gencoa Ltd; Alex Azzopardi, Gencoa Ltd; Tony Hart, Gencoa Ltd; Victor Bellido-Gonzalez, Gencoa Ltd
9:10 AM
Rotatable Magnetron Sputtering at the Right Pressure Point
Wilmert De Bosscher, Soleras Advanced Coatings; Niek Dewilde, Soleras Advanced Coatings; Jörg Oberste-Berghaus, Soleras Advanced Coatings
9:30 AM
9:40 AM
Nanoplasmonic (“Sub-Critical”) Silver as Optically Absorptive Layers in Solar-Control Glasses
Paul A. Medwick, Vitro Architectural Glass (formerly PPG Flat Glass); Andrew V. Wagner, Vitro Architectural Glass (formerly PPG Flat Glass); Adam D. Polcyn, Vitro Architectural Glass (formerly PPG Flat Glass); Patrick J. Fisher, Vitro Architectural Glass (formerly PPG Flat Glass)
10:00 AM
Thermochromic VO2: Performance enhancement and application opportunities
Bill Baloukas, Polytechnique Montreal; Simon Loquai, Polytechnique Montreal; Ludvik Martinu, Polytechnique Montreal
10:20 AM
Recent Developments of Optimized ITO Coatings on Ultra-Thin Flexible Glass in S2S and R2R processes
Manuela Junghaehnel, Fraunhofer Institute for Organic Electronics, Electron Beam and Plasma Technology FEP; Jasper Westphalen, Fraunhofer Institute for Organic Electronics, Electron Beam and Plasma Technology FEP; Falk Naumann, Fraunhofer Institute for Applied Microstructure of Materials and Systems IMWS; Georg Lorenz, Fraunhofer Institute for Applied Microstructure of Materials and Systems IMWS; Thomas Preußner, Fraunhofer Institute for Organic Electronics, Electron Beam and Plasma Technology FEP; Matthias Fahland, Fraunhofer Institute for Organic Electronics, Electron Beam and Plasma Technology FEP
10:40 AM
Durability and wear mechanisms of easy-to-clean coatings on glass assessed by in situ tribometry
Jincheng Qian, Polytechnique Montreal; Thomas Schmitt, Polytechnique Montreal; Bill Baloukas, Polytechnique Montreal; Jolanta E. Klemberg-Sapieha, Polytechnique Montreal; Ludvik Martinu, Polytechnique Montreal; Carlo A. Kosik-Williams, Corning Inc.; James J. Price, Corning Inc.; Eric L. Null, Corning Inc.