The Role of Micro-Scale Analysis Tools in Industrial Problem Solving

Wednesday, September 14, 2022: 4:00 PM
Convention Center: 262 (Ernest N. Morial Convention Center)
Ms. Jeanette Vass , Auto & Materials, Landenberg, PA
Detecting, testing, preventing, and controlling failure mechanisms in the manufacturing/production realm are key to ensuring reliability of commercial and consumer products. Characterization and identification of micron and submicron size particles are essential for understanding and managing certain manufacturing processes. A focus on achieving manufacturers’ goals, such as producing quality products with consistent, reliable performance within a reasonably competitive price range, requires careful planning and proper method practices/approaches.

The objective of this presentation is to describe and demonstrate the purpose/value of SEM/EDS, FT-IR, Raman and other non-destructive, micro-spectroscopic tools, as they provide valuable information for unknown materials’ chemical compositions, identities and structures” in unknown materials’ chemical composition, identity and structures while/solving manufacturing problems with emphasis on ensuring quality assurance.

My presentation will classify, compare, and contrast the advantages and limitations of the most common micro-scale analytical instruments, thereby providing the audience with a convenient user-selection selector guide.

Through specific case studies, I will demonstrate the practical applications of the Micro-Scale Analysis Tools for problem solving. I will also present the spectroscopists’ challenges regarding data acquisition and results interpretation to achieve accurate, meaningful results.

Furthermore, my talk will reveal how the knowledge of the specific, critical product performance parameters is essential and should determine the selection of the available instrument choices.

The talk will establish how a systematic approach for selecting the most suitable micro-scale instruments is crucial for maximizing benefits and results. This will be illustrated with the aid of micro-graphs, spectral data, and photographs.

I will conclude my presentation by providing the audience with a fresh understanding of the many micro-scale analytical tools currently available along with their development over the years. This presentation will illustrate how the consistent and proper utilization of such tools will results in minimizing product failures, thereby saving business reputation as well as reducing the high costs associated with such failures.