Microstructural Characterization IV

Wednesday, September 14, 2022: 4:00 PM-5:00 PM
Convention Center: 262 (Ernest N. Morial Convention Center)
Mr. Joseph Quinn, Metallurgical & Materials Engineering Consulting and Mr. Michael Engstler, Saarland University
4:00 PM
4:20 PM
Correlative Tomography – Comparing X-ray Nanotomography and Focused Ion Beam Serial Sectioning
Mr. Michael Engstler, Saarland University; Mr. Jonas Fell, Saarland University; Mr. Hans-Georg Herrmann, Fraunhofer IZFP; Prof. Frank Mücklich, Material Engineering Center Saarland