International Materials Applications & Technologies Conference and Exposition - IMAT (Sept. 12 - 15, 2022): EDFAS Tutorial - Diffraction in the SEM: What, Why, and How You Can Do This in Your Microscope AND Microelectronic Yield Characterization

EDFAS Tutorial - Diffraction in the SEM: What, Why, and How You Can Do This in Your Microscope AND Microelectronic Yield Characterization

Wednesday, September 14, 2022: 8:00 AM-10:00 AM

Convention Center: 272 (Ernest N. Morial Convention Center)

Dr. James Demarest, IBM

8:00 AM

Transmission Electron Imaging AND Diffraction in the SEM: What, Why, and How You Can Do This in Your Microscope
Dr. Jason Holm, National Institute of Standards and Technology

9:00 AM

Microelectronic Yield Characterization
Mr. David Albert, IBM (Retired)

See more of: EDFAS Tutorials

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