Tools & Techniques (Joint EDFAS and FAS Programming) III

Tuesday, September 29, 2026: 8:00 AM-10:40 AM
306A (Québec City Convention Centre)
Session talks highlighting various materials science-related tools and techniques utilized to analyze and to interrogate the contributing factors and root causes of component failures.
8:00 AM
Failure analysis of a faucet supply line
Dr. Eric Weishaupt, PhD, PE, Bruch Engineering
8:20 AM
ABD : a novel way to avoid machine design failures in stressed environments !
Mr. Pierre DUPONT, UMONS - Faculté polytechnique de MONS (FPMs)
8:40 AM
Using FEA for Failure Analysis in Thermo-Mechanical Systems
Dr. Alix de Pannemaecker, PhD, PE, PEng, Secretariat; Dr. Nicolas Cunningham, PhD, PEng, Secretariat Advisors Canada Limited
9:00 AM
Artificial Intelligence Assisted Failure Analysis: Automated Extraction, Classification, and Root-Cause Determination. A Study Assessing the Capability of Current AI Tools
Ms. Elisabeth A Kuebel, The Ohio State University; Dr. Elvin Beach, The Ohio State University
9:20 AM
Failure Analysis for AI and Advanced Semiconductors: Locating the Most Difficult to Find Defects Using Ultra-high Frequency Nanoprobing
Dr. Scott Lockledge, Ph.D., Tiptek, LLC
9:40 AM
A Review of Defect Localization Techniques in FinFET Devices Using EBIC, EBAC, and EBIRCH with Nanoprobing
Dr. Daminda Dahanayaka, IBM Research
10:00 AM
Root Cause Failure Analysis of Non-Drive End (NDE) Bearing Failure in updraft-drying (UDD) Fan
Mr. Archit Mudugu, Tata Steel; Mr. Kaushal Singh, Tata Steel; Mr. Susovan Das, Tata Steel; Mr. Sudipta Ghosh, Tata Steel
10:20 AM
Innovative Decapsulation Methodology for Multi-Stacked Die Devices A Hybrid Laser and Chemical Approach
Mr. Brian P. Yabut, onsemi; Ms. Rona Victoria C. Balabbo, onsemi; Mr. Mac Hariss H. Masiris, onsemi; Mr. Michael A. Enriquez, onsemi; Mr. Rodleo A. Gonzales, onsemi
See more of: Failure Analysis Society (FAS) at IMAT
<< Previous Session | Next Session >>