Tools & Techniques (Joint EDFAS and FAS Programming) III

Tuesday, September 29, 2026: 8:00 AM-10:40 AM
306A (Québec City Convention Centre)
Session talks highlighting various materials science-related tools and techniques utilized to analyze and to interrogate the contributing factors and root causes of component failures. Ms. Elisabeth A Kuebel1, Aaron Tanzer2, Dr. Noah Budiansky, Ph.D., P.E.3, Mr. Tomasz Didenko4, Mr. Robert Cooley, P.E.5, Ms. Renee Parente6, Mr. Kristofor Dickson6 and Yan Li7, (1)The Ohio State University(2)Mr. Failure(3)Exponent, Inc.(4)GE Aerospace(5)Engineering Systems Inc.(6)AMD(7)MediaTek
8:00 AM
Failure analysis of a faucet supply line
Dr. Eric Weishaupt, PhD, PE, Bruch Engineering
8:20 AM
ABD : a novel way to avoid machine design failures in stressed environments !
Mr. Pierre DUPONT, UMONS - Faculté polytechnique de MONS (FPMs)
8:40 AM
Using FEA for Failure Analysis in Thermo-Mechanical Systems
Dr. Alix de Pannemaecker, PhD, PE, PEng, Secretariat; Dr. Nicolas Cunningham, PhD, PEng, Secretariat Advisors Canada Limited
9:00 AM
Artificial Intelligence Assisted Failure Analysis: Automated Extraction, Classification, and Root-Cause Determination. A Study Assessing the Capability of Current AI Tools
Dr. Elvin Beach, The Ohio State University; Ms. Elisabeth A Kuebel, The Ohio State University
9:20 AM
Failure Analysis for AI and Advanced Semiconductors: Locating the Most Difficult to Find Defects Using Ultra-high Frequency Nanoprobing
Dr. Scott Lockledge, Ph.D., Tiptek, LLC
9:40 AM
A Review of Defect Localization Techniques in FinFET Devices Using EBIC, EBAC, and EBIRCH with Nanoprobing
Dr. Daminda Dahanayaka, IBM Research
10:00 AM
Root Cause Failure Analysis of Non-Drive End (NDE) Bearing Failure in updraft-drying (UDD) Fan
Mr. Archit Mudugu, Tata Steel; Mr. Kaushal Singh, Tata Steel; Mr. Susovan Das, Tata Steel; Mr. Sudipta Ghosh, Tata Steel
10:20 AM
Innovative Decapsulation Methodology for Multi-Stacked Die Devices A Hybrid Laser and Chemical Approach
Mr. Brian P. Yabut, onsemi; Ms. Rona Victoria C. Balabbo, onsemi; Mr. Mac Hariss H. Masiris, onsemi; Mr. Michael A. Enriquez, onsemi; Mr. Rodleo A. Gonzales, onsemi
See more of: Failure Analysis Society (FAS)
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