Infra-Red Reflectance Microscopy for Daisy Chain Flip-Chip Device Failure Analysis
C. Grilletto, D. J. D. Sullivan, K. Tang, LSI Logic, Milpitas, CA; S. Hsiung, LSI Logic, Fremont, CA; A. J. Komrowski, LSI Logic Corp., Fremont, CA; J. Soopikian, LSI Logic Corporation, Fremont, CA
