ISTFA Home      Exposition      To Register      ASM Homepage
Back to "Session 15: Optoelectronic Devices" Search
  Back to "Symposium" Search  Back to Main Search

Wednesday, November 17, 2004 - 4:35 PM
15.2

Automated Visual Inspection Tool (AVIT) System for Fiber Endface Inspection

B. Roche, T. Mitcheltree, J. Duffy, Cisco Systems Inc., Salem, NH; D. Wilson, W. Lootsma, PVI Systems Inc., Niantic, CT; M. Lewandowski, Molex, Inc., Downers Grove, IL; R. Trotabas, Molex Fiber Optics, Downers Grove, IL

View in PDF format