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| Session 15: Optoelectronic Devices | ||||
| Location: Jr. Ballroom (Worcester's Centrum Centre) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: The Optoelectronic Device session will present characterization and failure analysis techniques across a variety of applications including lasers, light emitting diodes, detectors and fiber optics. Papers will focus on specific
defects, their detection, and acceleration factors. | ||||
| Editors: | Dr. Timothy A. Strand Agility Communications, Goleta, CA Dr. Devin Leonard Rockwell Scientific Company, Camarillo, CA James Cargo Agere Systems, Allentown, PA Mr. Stanley Swieck Analog Devices, Wilmington, MA Mr. Michael Eskenazi Qualcomm Corporation, San Diego, CA Felix Beaudoin IBM Mr. Ted Hasegawa National Semiconductor, Santa Clara, CA Mr. David Vallett IBM Systems and Technology Group, Essex Jct., VT | |||
| Session Chair: | Dr. Daniel L. Barton Sandia National Laboratories, Albuquerque, NM | |||
| 4:10 PM | 15.1 | PLENARY TALK: Characterization of VCSEL-array degradation induced by elevated temperature and humidity | ||
| 4:35 PM | 15.2 | Automated Visual Inspection Tool (AVIT) System for Fiber Endface Inspection | ||
| 5:00 PM | 15.3 | Failure Mechanisms of Contact Vias in Organic Light Emitting Diode Displays | ||
| 5:25 PM | 15.4 | Complementary EBIC and SEM Analysis of ESD Induced Failures in PIN Photodiodes | ||