Correlation of Flash Memory Defects Detected with Passive and Active Localization Techniques
A. Quah, J. Phang, National University of Singapore, Singapore, Singapore; S. Li, M. Massoodi, C. Yuan, Spansion Inc, Sunnyvale, Sunnyvale, CA; L. Koh, K. Chan, C. Chua, SEMICAPS PTE LTD, Singapore, Singapore, Singapore
