ISTFA Home
Exposition
To Register
ASM Homepage
Back to "Session 13: Metrology and Materials Analysis 1" Search
Back to "Symposium" Search
Back to Main Search
Wednesday, November 17, 2004 - 3:00 PM
13.3
Identification and Characterization of Ultra-thin (<100 nm) Flakes Using a Combination of Face-Lapping, High Energy (10 kV) SEM Voltage Imaging, and TEM
D. M. Mitro
, Motorola SPS, Austin, TX
View in PDF format
