ISTFA Home      Exposition      To Register      ASM Homepage
Back to "Session 26: Circuit Edit for FA, FI and Debug 2" Search
  Back to "Symposium" Search  Back to Main Search

Thursday, November 18, 2004 - 3:05 PM
26.1

Optimizing FIB Depositions and Gas-Assited Etching

C. Rue, FEI Company, Hillsboro, OR; S. Herschbein, C. Scrudato, IBM Systems & Technology, Hopewell Junction, NY; L. Fischer, IBM, Hopewell Junction, NY

View in WORD format