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Tuesday, November 16, 2004 - 9:35 AM
2.2
Spray Cooling for Time Resolved Emission Measurements of ICs
R. Goruganthu, D. Bethke, S. McBride, AMD, Austin, TX; T. Crawford, J. Frank, D. Cotton, Credence Systems, Mountain View, CA; T. Cader, Isothermal Systems Research, Liberty Lake, WA
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