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| Session 2: Advanced Techniques | ||||
| Location: South Ballroom (Worcester's Centrum Centre) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: This session opens with a new phase detection scheme for laser voltage probing using polarization difference probing technique, followed by a spray cooling technique for time resolved emission measurements on high power devices, then introduces a novel technique for detecting high resistance faults using electroplating, and finally closes with a comparative case review from a user’s perspective using different magnetic current imaging sensors. | ||||
| Editors: | Mr. Ted Hasegawa National Semiconductor, Santa Clara, CA Felix Beaudoin IBM Mr. Michael Eskenazi Qualcomm Corporation, San Diego, CA Mr. Stanley Swieck Analog Devices, Wilmington, MA James Cargo Agere Systems, Allentown, PA Dr. Zhiyong Wang Intel Corporation, Chandler, AZ Mr. David Vallett IBM Systems and Technology Group, Essex Jct., VT | |||
| Session Chair: | Dr. Zhiyong Wang Intel Corporation, Chandler, AZ | |||
| 9:10 AM | 2.1 | PLENARY TALK: Polarization Difference Probing: A New Phase Detection Scheme for Laser Voltage Probing | ||
| 9:35 AM | 2.2 | Spray Cooling for Time Resolved Emission Measurements of ICs | ||
| 10:00 AM | 2.3 | A Novel Technique for Detecting High Resistance Fault Using Electroplating | ||
| 10:25 AM | 2.4 | Magnetic Current Imaging Techniques: Comparative Case Studies | ||
| 10:50 AM | Break | |||