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Wednesday, November 17, 2004 - 12:00 AM
P14
Failure Modes, Reliability Analysis and Case Studies on Integration of Copper and Low k Technology
T. Bucha, J. Cargo, Agere Systems, Allentown, PA; H. Wu, Vishay Siliconix, Santa Clara, CA; M. White, Lehigh University, Bethlehem, PA
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