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Tuesday, November 16, 2004 - 10:25 AM
2.4

Magnetic Current Imaging Techniques: Comparative Case Studies

P. Descamps, Philips Semiconductors, CAEN, France; O. Crepel, Freescale Semiconductor SAS, Toulouse, France; P. Poirier, NXP Semiconductors, CAEN, France; R. Desplats, CNES - French Space Agency, Toulouse, France; P. Perdu, CNES-French Space Agency, 31401 Toulouse Cedex 9, France; A. Firiti, ST Microelectronics, Rousset, France

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