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Tuesday, November 16, 2004 - 3:10 PM
5.5
A Novel X-ray Microtomography System with High Resolution and Throughput For Non-Destructive 3D Imaging of Advanced Packages
D. Scott, S. Kamath, D. Trapp, W. Yun, Xradia, Inc., Concord, CA; S. Wang, Xradia Inc, Concord, CA
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