This seminar is designed to familiarize the attendees with the failure analysis and reliability issues associated with optoelectronic devices. The seminar will be divided into two sections. The first will cover reliability testing and “classic” degradation issues associated with LEDs, lasers, and photodetectors. The remainder of the seminar will address the tools and techniques needed for failure analysis of optoelectronics devices. The seminar will stress the interplay between the electrical and optical properties of the devices, which adds a significant complication in the analysis of these seemingly simple but actually very complex devices.