|
||||
| Back to "Tutorial" Search | Back to Main Search | |||
| Device and Test 2 | ||||
| Location: Jr. Ballroom (Worcester's Centrum Centre) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Editors: | Mr. David Vallett IBM Systems and Technology Group, Essex Jct., VT Dr. William Vanderlinde Laboratory for Physical Sciences, College Park, MD | |||
| Session Chairs: | Ms. Becky Holdford Texas Instruments, Dallas, TX Mr. Tracy Myers ON Semiconductor, Gresham, OR | |||
| 12:15 PM | Lunch | |||
| 1:15 PM | Failure Analysis of SRAM Memory | |||
| 2:15 PM | Flash Memory Failure Analysis | |||
| 3:15 PM | Optoelectronic Device Failure Analysis Technique and Failure Modes | |||
| 4:15 PM | Break | |||
| 4:30 PM | Failure Analysis of Passive Components | |||