ISTFA Home      Exposition      To Register      ASM Homepage
Back to "Microscopy Tools 1" Search
  Back to "Tutorial" Search  Back to Main Search

Sunday, November 14, 2004 - 11:30 AM

The Role of the AFM in Failure and Yield Analysis II

A. N. Erickson, Multiprobe, Inc, Santa Barbara, CA

This is part 2 of the tutorial.