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Thursday, November 10, 2005 - 3:50 PM
SYMP0524.2
Sectioning Integrated Circuit Ceramic Packages for Improved Electromigration Failure Analysis
B. Tracy, Spansion, LCC, Sunnyvale, CA; J. Barragan, Spansion, Sunnyvale, CA; E. Raz, Gatan Inc, Pleasanton, CA; Z. Shafrir, Sagitta, Kfar Saba, Israel
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