ISTFA Home      Exposition      To Register      ASM Homepage
Back to "Device and Test 2" Search
  Back to "Tutorial" Search  Back to Main Search

Sunday, November 6, 2005 - 1:00 PM
GEN052.1

Failure Analysis of SRAM Memory

S. Gunturi, Texas Instruments, Dallas, TX

Failure analysis of SRAM memory requires the understanding of the components of cell, the operation of SRAM, layout, testing and the electrical signature of the fails. An overview of all the above aspects will be provided as an introduction. The methodology of failure analysis of SRAM is described showing the interaction of SRAM testing, electrical failure signature and the probable cause of fail, which can lead to physical failure analysis.