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| Device and Test 2 | ||||
| Location: Meeting Room J1 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Editor: | Mr. Jeremy A. Walraven Sandia National Labs, Albuquerque, NM | |||
| Session Chairs: | Mr. Tracy Myers ON Semiconductor, Gresham, OR Ms. Susan Li Spansion Inc, Sunnyvale, CA | |||
| 1:00 PM | GEN052.1 | Failure Analysis of SRAM Memory | ||
| 2:00 PM | GEN052.2 | FLASH Memory Failure Analysis | ||
| 3:00 PM | GEN0517.3 | Scan Diagnostics | ||
| 4:00 PM | Break | |||
| 4:15 PM | GEN0511.3 | Automated Test Pattern Generation (New for 2005) | ||