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Sunday, November 6, 2005 - 11:20 AM
GEN051.4

Failure Analysis of DRAM Memories

M. Versen, University of Applied Sciences Rosenheim, Rosenheim, Germany

Failure analysis of DRAMs requires an understanding of the functional operation and specific fail behaviours. The seminar explains how electrical failure analysis establishes the basis for a successful physical failure analysis. An introduction to the memory operation is given with a focus on the device response to external commands. Some failure analysis examples for the memory array are presented relating to read and write failures.