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| Device and Test 1 | ||||
| Location: Meeting Room J1 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: | ||||
| Editor: | Mr. Jeremy A. Walraven Sandia National Labs, Albuquerque, NM | |||
| Session Chairs: | Rose Ring SMSC Austin, Austin, TX Ms. Susan Li Spansion Inc, Sunnyvale, CA | |||
| 8:15 AM | GEN051.1 | CMOS Electronics and Defect Analysis | ||
| 9:15 AM | GEN051.2 | Failure Modes in Nanometer Technologies | ||
| 10:30 AM | Break | |||
| 10:45 AM | GEN051.3 | Analog Circuit Failure Analysis | ||
| 11:20 AM | GEN051.4 | Failure Analysis of DRAM Memories | ||