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Sunday, November 6, 2005 - 2:00 PM
GEN052.2

FLASH Memory Failure Analysis

S. Khalsa, O. D. Camposagrado, Intel Corporation, Folsom, CA

An overview of failure analysis tools and techniques used for NOR flash memory will be presented. The basics of NOR flash design and physics will introduce various failure modes and mechanisms. Tools and techniques for electrical and physical failure analysis will be described separately with a glimpse of future challenges.