At ISTFA basic logic testing tutorials were presented during previous years. This year, for the first time, a tutorial on advanced aspects of current logic testing and diagnosis will be presented. After a short introduction to the underlying ideas of logic testing, the focus is on the exploding number of defect mechanisms. One of these defect mechnisms are bridges. They will serve as an example during the remainder of the tutorial. The discussion of bridging defect covers for example logical versus electrical behavior or deterministic versus probabilistic test methods. As a consequence of the many different fault models and increasing quality requirements, current test pattern sets become rather large. Embedded deterministic test methods, like TestKompress(R) or SoCBIST(TM), are widely accepted solutions of this problem. The tutorial discusses the principle underlying techniques and describes some of the available methods in more detail. The implications of embedded testing and testing of defects for diagnosis are discussed in the end of the presentation.