ISTFA Home      Exposition      To Register      ASM Homepage
Back to "Session 3: Die Level Fault Isolation" Search
  Back to "Symposium" Search  Back to Main Search

Tuesday, November 8, 2005 - 11:25 AM
SYMP053.5

Failure Analysis of Soft Single Column Failure in Advanced 90nm SRAM Device with Internal Probing Techniques

H. S. Lin, W. T. Chang, C. H. Chao, C. T. Lin, J. Wang, UMC, Hsin-Chu City, Taiwan; C. Lin, No.3 Li-Hsin Rd. II , Science-Based Industrial Park, Hsin-Chu City,Taiwan 300, R.O.C., Hsin-CHu,Taiwan, Taiwan

View in WORD format