ISTFA Home
Exposition
To Register
ASM Homepage
Back to "Session 7: Case Histories 1" Search
Back to "Symposium" Search
Back to Main Search
Tuesday, November 8, 2005 - 3:40 PM
SYMP056.3
Topside Defect Localization Using OBIRCH Analysis
C. Howard, A. Weerakoon, D. M. Mitro, D. Glaeser, Freescale Semiconductor, Inc., Austin, TX
View in PDF format
