ISTFA Home      Exposition      To Register      ASM Homepage
Back to "Session 7: Case Histories 1" Search
  Back to "Symposium" Search  Back to Main Search

Tuesday, November 8, 2005 - 3:40 PM
SYMP056.3

Topside Defect Localization Using OBIRCH Analysis

C. Howard, A. Weerakoon, D. M. Mitro, D. Glaeser, Freescale Semiconductor, Inc., Austin, TX

View in PDF format