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| Session 7: Case Histories 1 | ||||
| Location: Meeting Room J3 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: This session covers individual analysis efforts on a component or group of components that provides additional insight into a failure mechanism or a method for analyzing components. The specific topics covered in this section include: memory failure analysis, probing and electrical characterization approaches for nanometer-scale technologies, and optical beam technique selection processes. | ||||
| Editors: | Mr. Tracy Myers ON Semiconductor, Gresham, OR Mr. Richard McClelland Philips Semiconductors, San Jose, CA Tim McGrady Atmel Corp., Colorado Springs, CO Mr. Tom Paquette Insight Analytical Labs, Colorado Springs, CO Mr. Chris Richardson Abound Solar, Fort Collins, CO | |||
| Session Chair: | Mr. Chris Richardson Abound Solar, Fort Collins, CO | |||
| 3:00 PM | SYMP056.1 | Complementary Optical Techniques for Advanced IC Failure Analysis – Case Study | ||
| 3:20 PM | SYMP056.2 | Scanning Optical Microscopy Application in Micron Memory Devices | ||
| 3:40 PM | SYMP056.3 | Topside Defect Localization Using OBIRCH Analysis | ||
| 4:00 PM | SYMP056.4 | Advanced Electrical Characterization of 90 nm Soft Bit Failure by Nano Probing Technique | ||