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Thursday, November 10, 2005 - 10:40 AM
SYMP0520.5
Hot Electron Induced Fiber Optic Transistor Beta Degradation, Recovery, and Dynamics of Hydrogen Atoms at the Si-SiO2 interface layer
K. Seo, J. Monarch, B. Dunlap, Metronic Microelectronics Center, Tempe, AZ
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