|
||||
| Back to "Symposium" Search | Back to Main Search | |||
| Session 20: Discretes, Passives, and MEMS | ||||
| Location: Meeting Room J3 (San Jose McEnery Convention Center) | ||||
| (Please check final room assignments on-site). | ||||
| Session Description: This session examines the analysis of discrete components, passive components, and microelectromechanical systems (MEMS). The papers cover transformer core failures, sealing problems on MEMS structures, power MOSFET failures, and gain degradation in discrete transistors. | ||||
| Editors: | Richard A. Blanchard Silicon Valley Expert Witness Group Inc., Mountain View, CA Mr. David Burgess Accelerated Analysis, Half Moon Bay, CA Mahmood Choudhry International Rectifier Corporation, Temecula, CA Dr. Dominique Collard CIRMM / IIS-CNRS, Institut of Industrial Science, University of Tokyo, Villeneuve d ascq, France Praveen M. Shenoy Fairchild Semiconductor, Mt Top, PA | |||
| Session Chair: | Mr. David Burgess Accelerated Analysis, Half Moon Bay, CA | |||
| 9:25 AM | SYMP0520.2 | Deprocessing of Integrated Sealing Structures from MEMS Devices for Failure Analysis | ||
| 9:50 AM | SYMP0520.3 | A New Non Destructive Method to Screen for Corona/Breakdown of a Transformer Core | ||
| 10:15 AM | SYMP0520.4 | Unique Autoclave Stress Induced Failure Mechanism | ||
| 10:40 AM | SYMP0520.5 | Hot Electron Induced Fiber Optic Transistor Beta Degradation, Recovery, and Dynamics of Hydrogen Atoms at the Si-SiO2 interface layer | ||