ISTFA Home
Exposition
To Register
ASM Homepage
Back to "Session 15: Sample Preparation 1" Search
Back to "Symposium" Search
Back to Main Search
Wednesday, November 9, 2005 - 5:05 PM
SYMP0516.4
Failure Analysis of Electronic and Microelectronic Components with a New Automatic Target Preparation System
K. Reiter, Fraunhofer Institute of Silicon Technology, Itzehoe, Germany; H. Bundgaard, Struers A/S, Ballerup, Denmark
View in PDF format