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Wednesday, November 9, 2005 - 4:40 PM
SYMP0515.3
Physics of Failure Investigation of Dark vertical-cavity surface-emitting lasers: Detection of Reverse-Bias Electroluminescence by Photo-Emission Microscopy
D. K. McElfresh, L. D. Lopez, R. Melanson, D. Vacar, Sun Microsystems, San Diego, CA
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