Guideline for Interpreting IR Laser Stimulation Signal on Semiconductors Materials and Improving Failure Analysis Flow
A. Firiti, G. Haller, ST Microelectronics, Rousset, France; F. Beaudoin, IBM; P. Perdu, CNES-French Space Agency, 31401 Toulouse Cedex 9, France; D. Lewis, P. Fouillat, IXL laboratory, Talence, France
