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Wednesday, November 9, 2005 - 8:50 AM
SYMP0510.7

Guideline for Interpreting IR Laser Stimulation Signal on Semiconductors Materials and Improving Failure Analysis Flow

A. Firiti, G. Haller, ST Microelectronics, Rousset, France; F. Beaudoin, IBM; P. Perdu, CNES-French Space Agency, 31401 Toulouse Cedex 9, France; D. Lewis, P. Fouillat, IXL laboratory, Talence, France

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