Analog Circuit Failure Analysis Using Time-Resolved Emission
B. J. Cain, A. Syed, Credence Systems Corp, Sunnyvale, CA; G. L. Woods, Rice University, Houston, TX; R. Herlein, Credence Systems Corp, San Jose, CA; T. Nomura, Credence Systems Corp, Kawasaki-shi,Kanagawa-ken, Japan
